Wafer-Level Test Interface Authority
20μm Precision. Total Integrity.
POGO SPRING PIN PROBE CARD
| Specification | Detail |
| Bump Type | Eutectic or Pb-Free Solder or Cu Pillar |
| Applicable Pitch | 200μm or above |
| Tip Extension | Customized as requested |
| Max OT | Customized as requested |
| Tip Depth (from Wafer Side) | Customized as requested (+/-10mil) |
| Balanced Contact Force | Min 0.5g/mil (+/-20%) |
| Operating Temperature | -40°C to 125°C |
| Spring Pin Tips | Hardened Be-Cu / Au |
| Self Inductance | 0.56nH |
| Bandwidth | Up to 15 GHz @ -3dB |
| Contact Resistance | 100mOhm |
| Current Rating | Up to 2A |
PRODUCT IMPROVEMENT
Test probe is addressing the current market trends with heavy investment into R&D:
Increasing # probes / Parallelism / Current per probe
Smaller pitches / Controlled & smaller scrub marks
Superior alignment & planarity
Stable & reduced Contact Resistance (CRES)
Low probe force to reduce bump, pad, and inner dielectric damage
Replaceable individual probes for easy maintenance
Signal integrity requirements that are driving complexity in tooling design & architecture
PCB DESIGN
Full-Range PCB Design: Offer full range of PCB design including Digital, Analog, Multi-layer PCB, and Mixed signal.
Design & Fabrication: Provide design and fabrication solutions on probe card PCBs and load boards.
Comprehensive Solutions: Provide full solutions with component assembly and reverse engineering on PCBs according to customer's request.
Competitive Edge: Very competitive pricing with fast delivery time (2 weeks).
•Test Probe Co., Ltd delivers high quality
Cantilever/ Epoxy Probe Cards that average a
higher number of “touchdowns” ( 1million).
•Fromsingle tomulti-die configurations, Test Probe consistently delivers high probe count( up to 2,000 probes ) Probe Cardswithin 7working days orless.
•100% of our probe card are tested on our stateof-the-art Probe CardAnalyzers and are guaranteed tomatch the X,Y coordinates supplied with our customer’s design input data.
TEST PROBE consistently delivers high quality Vertical Probe Cards that average a higher number of “touchdowns” (>500,000)
•The benefitto our customers are significantly reducedwafertest costs
•TEST PROBE Co., Ltd provides Cobra Vertical Probe Cards.Our Probe Cards provide the following advantages:
•Easy maintenance
•Longerlife span (Use 14.5~15 Mils Tip length)
•Fastlead-time: 3weeks for newbuild and 1 week forrebuild ( change probes )
•Minimumpitch down to 60 µm
•Test Temperatures from-40 °C to +155 °C
